Welcome from
Prem Paul,
Vice Chancellor for Research, UNL

"Applications of Ellipsometry to Thin-Film Characterization"
Ping He, J.A. Woollam Co., Lincoln

Session 1 - Magnetic Materials / Hard Magnets: Mike McFarland, ACREE Technolgies Inc.

Session 2 - Magnetic Sensors/TMR/GMR: Olle Heinonen, Seagate Technology LLC

Session 3 - Magnetic Films/Data Storage: Jan-Ulrich Thiele, Hitachi Global Storage Technologies

Session 3 - Magnetic Films/Data Storage: Bin Lu, Seagate Technology LLC