Electron Microscopy
The function of the Central Facility for Electron Microscopy is to provide hands-on access to electron microscopes, sample preparation equipment plus data collection and data reduction instrumentation, along with advice, training and research collaboration. The scope of the Facility is materials characterization of the topography, morphology, ele-mental composition, crystalline microstructure, crystal defects, and atomic arrangements of materials, largely on a scale from 10 micrometers down to the near-atomic level.
Main equipment:
The facility is equipped with:
(1) JEOL JEM 2010 transmission electron microscope
200kV, analytical/high-resolution mode, LaB6 filament, single-tilting
and double-tilting sample holders. (Oxford EDS system, Gatan dual-view
CCD camera, TSL texture analysis system, Digi-TEM beam control system).
(2) JEOL JSM 840A scanning electron microscope
LaB6 filament, second electron and backscattered electron detectors, Kevex
Quantum x-ray microanalyzer, Digital imaging system.
(3) VG Microscopes HB501 STEM
Field emission scanning transmission electron microscope, now including:
Windowless x-ray microanalysis (Oxford/ 4pi), Digital image acquisition
(4pi), Parallel-acquisi-tion ELLS, Energy-filtered electron diffraction,
Differential phase contrast detector, Electron beam induced nanofabrication
facility.
Users of the facility:
The Facility is accessible to all qualified researchers at UNL, at other universities and in industrial and other laboratories on payment of the appropriate charges.
Under normal circumstance, these researchers will be expected to have the requisite background knowledge for electron characterization of materials before some training will be given for a particular instrument.
In some cases, research collaboration is possible for common research interests and/or if researchers need the capabilities of the equipment and experienced examination of samples but are unable to use the facilities for themselves. Limited full service handling and examination of materials is available for these researchers according to availability of the facility specialist.
Prof. Brian W. Robertson, Faculty Supervisor
Dr. Xingzhong “Jim” Li, Specialist
Location: 12B/12C Walter Scott Engineering Center
University of Nebraska
Lincoln, NE 68588-0656
phone: (402) 472-8762
e-mail: xli2@unl.edu
website: www.unl.edu/CMRAcfem/
Facility specialist, Dr. Xingzhong Li, with the
JEOL JEM 2010 TEM.
This TEM is primarily for atomic-scale imaging, nanometer scale diffraction
and x-ray analysis of suitably thin materials to determine their microstructure,
morphology and crystal structures.
